Microphotoluminescence and perfect ordering of SiGe islands on pit-patterned Si(001) substrates

Nanotechnology

Volumn 22, Issue 16, 2011, Pages

  Hackl, Florian ^a   Grydlik, Martyna ^a   Brehm, Moritz ^a   Groiss, Heiko ^a   Schäffler, Friedrich ^a   Fromherz, Thomas ^a   Bauer, Günther ^a  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE; BLUE SHIFT; MICROPHOTOLUMINESCENCE; OPTOELECTRONIC PROPERTIES; PER UNIT; PHOTOLUMINESCENCE EMISSION; PL EMISSION; SI (001) SUBSTRATE; SIGE ISLANDS; TRANSMISSION ELECTRON MICROSCOPE;

GERMANIUM; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; SILICON ALLOYS; TRANSMISSION ELECTRON MICROSCOPY;

SILICON;

GERMANIUM; NANOMATERIAL; SILICON;

ARTICLE; CHEMISTRY; LUMINESCENCE; MATERIALS TESTING; METHODOLOGY; PARTICLE SIZE; ULTRASTRUCTURE;

GERMANIUM; LUMINESCENT MEASUREMENTS; MATERIALS TESTING; NANOSTRUCTURES; PARTICLE SIZE; SILICON;

EID: 79952641888     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/16/165302     Document Type: Article

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