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Volumn 11, Issue , 2009, Pages

Combined structural and photoluminescence study of SiGe islands on Si substrates: Comparison with realistic energy level calculations

Author keywords

[No Author keywords available]

Indexed keywords

3D SIMULATIONS; COMPRESSIVE STRAIN; ENERGY LEVEL; GE CONCENTRATIONS; GE CONTENT; GE PROFILE; GROWTH CONDITIONS; GROWTH DIRECTIONS; HEAVY HOLES; HIGH RESOLUTION X RAY DIFFRACTION; INPUT PARAMETER; ISLAND SHAPE; LIGHT HOLES; PHOTOLUMINESCENCE SPECTRUM; RELATIVE IMPORTANCE; SI MATRIX; SI SUBSTRATES; SI-GE ALLOYS; SIGE ISLANDS; STRAIN FIELDS; STRANSKI-KRASTANOW GROWTH;

EID: 67650081128     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/11/6/063021     Document Type: Article
Times cited : (37)

References (37)
  • 1
    • 67650010661 scopus 로고    scopus 로고
    • Silicon microphotonics
    • The Microphotonics Center at MIT pp
    • Bautista J et al 2005 Silicon microphotonics Microphotonics: Hardware for the Information Age (http://mphroadmap. mit.edu/index.php? option=com content&view=article&id=61&Itemid=76: The Microphotonics Center at MIT) pp 1-30
    • (2005) Microphotonics: Hardware for the Information Age , pp. 1-30
    • Bautista, J.1
  • 24
    • 0000330778 scopus 로고    scopus 로고
    • Floro J A, Chason E, Freund L B, Twesten R D, Hwang R Q and Lucadamo G A 1999 Phys. Rev. B 59 1990
    • Floro J A, Chason E, Freund L B, Twesten R D, Hwang R Q and Lucadamo G A 1999 Phys. Rev. B 59 1990
  • 29
    • 0003644756 scopus 로고    scopus 로고
    • Properties of Silicon Germanium and SiGe
    • Carbon , London: INSPEC
    • de Walle C G V 2000 Properties of Silicon Germanium and SiGe:Carbon (EMIS Data Review Series vol 24) (London: INSPEC)
    • (2000) EMIS Data Review Series , vol.24
    • de Walle, C.G.V.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.