Extended shape evolution of low mismatch Si 1-xGe x alloy islands on Si(100)

Applied Physics Letters

Volumn 84, Issue 13, 2004, Pages 2262-2264

  Sutter, E ^a,b   Sutter, P ^a,b   Bernard, J E ^a  

^a Department of Geology and Geological Engineering   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CROSS-SECTIONAL TRANSMISSION ELECTRON MICROSCOPY (XTEM); EXTENDED SHAPE EVOLUTION; SHAPE TRANSITIONS; STRAIN RELAXATION;

CONTACT ANGLE; DISLOCATIONS (CRYSTALS); GERMANIUM ALLOYS; INTERFACES (MATERIALS); NUCLEATION; PHASE TRANSITIONS; RELAXATION PROCESSES; SCANNING TUNNELING MICROSCOPY; STRAIN; SURFACE TENSION; TRANSMISSION ELECTRON MICROSCOPY;

SILICON ALLOYS;

EID: 2142659370     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1669068     Document Type: Article

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