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Volumn 253, Issue 1, 2010, Pages

Structure-related strain and stress in thin hydrogenated microcrystalline silicon films

Author keywords

[No Author keywords available]

Indexed keywords

HYDROGENATION; MOLECULAR ELECTRONICS; NANOCRYSTALLITES; NANOCRYSTALS; RAMAN SCATTERING; SILICON WAFERS; STRESS-STRAIN CURVES; THIN FILMS;

EID: 79952405693     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/253/1/012056     Document Type: Conference Paper
Times cited : (3)

References (33)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.