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Volumn 69-70, Issue , 2000, Pages 559-563
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The role of hydrogen in the formation of microcrystalline silicon
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Author keywords
Hydrogen; Low temperatures; Microcrystalline silicon films
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Indexed keywords
ELECTRIC CONDUCTIVITY MEASUREMENT;
ELLIPSOMETRY;
FILM GROWTH;
HIGH RESOLUTION ELECTRON MICROSCOPY;
LOW TEMPERATURE OPERATIONS;
SEMICONDUCTING FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
DARK CONDUCTIVITY;
SEMICONDUCTING SILICON;
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EID: 0033907222
PISSN: 09215107
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-5107(99)00324-4 Document Type: Article |
Times cited : (49)
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References (20)
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