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Volumn 159-160, Issue C, 2009, Pages 34-37

Evidence of bimodal crystallite size distribution in μc-Si:H films

Author keywords

Atomic force microscopy (AFM); Ellipsometry; Raman spectroscopy; Silicon; Structural properties; Thin films

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CRYSTALLITE SIZE; METALLIC FILMS; MICROCRYSTALLINE SILICON; SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS; X RAY DIFFRACTION;

EID: 67349240399     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2008.11.048     Document Type: Article
Times cited : (6)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.