In situ Raman scattering studies of the amorphous and crystalline Si nanoparticles

Solid State Communications

Volumn 113, Issue 10, 2000, Pages 553-558

  Sirenko, A A ^a   Fox, J R ^a   Akimov, I A ^a,b   Xi, X X ^a   Ruvimov, S ^c   Liliental Weber, Z ^c  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b IOFFE INSTITUTE   (Russian Federation)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; CRYSTALLINE MATERIALS; CRYSTALLIZATION; MAGNETRON SPUTTERING; PHONONS; RAMAN SCATTERING; TRANSMISSION ELECTRON MICROSCOPY;

INELASTIC LIGHT SCATTERING; NANOPARTICLES;

NANOSTRUCTURED MATERIALS;

EID: 0033895421     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(99)00539-6     Document Type: Article

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