Preparation and characterization of MgO stepped surfaces

Surface Science

Volumn 601, Issue 13, 2007, Pages 2636-2640

  Benedetti, S ^a,b   Torelli, P ^a   Luches, P ^a   Gualtieri, E ^a,b   Rota, A ^a   Valeri, S ^a,b  

^a CNR   (Italy)

^b UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

Author keywords

Atomic force microscopy; Magnesium oxide; Stepped single crystal surface; XPS

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; LOW ENERGY ELECTRON DIFFRACTION; MAGNESIA; NANOSTRUCTURES; X RAY PHOTOELECTRON SPECTROSCOPY;

METALLIC NANOSTRUCTURES; STEPPED SINGLE CRYSTAL SURFACE;

SURFACE STRUCTURE;

EID: 34250699940     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.11.066     Document Type: Article

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