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Volumn 169, Issue 3, 1996, Pages 474-479

Preparation and characterization of epitaxial MgO thin film by atmospheric-pressure metalorganic chemical vapor deposition

Author keywords

[No Author keywords available]

Indexed keywords

ATMOSPHERIC PRESSURE; CRYSTAL ORIENTATION; EPITAXIAL GROWTH; METALLORGANIC CHEMICAL VAPOR DEPOSITION; SEMICONDUCTING FILMS; SINGLE CRYSTALS; SUBSTRATES; SURFACE STRUCTURE; THERMAL EFFECTS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 0030413235     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(96)00411-3     Document Type: Article
Times cited : (32)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.