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Volumn 57, Issue 1, 2011, Pages 61-68

Investigation of transient fault effects in synchronous and asynchronous network on chip router

Author keywords

Asynchronous and synchronous design; Fault injection; Fault tolerance evaluation; Network on chip router

Indexed keywords

ASYNCHRONOUS AND SYNCHRONOUS DESIGN; ASYNCHRONOUS DESIGN; ASYNCHRONOUS NETWORKS; FAILURE RATE; FAULT INJECTION; FAULT INJECTOR; FAULT MODEL; FAULT PROPAGATION; FAULT-TOLERANT; NETWORK ON CHIP; SIMULATION-BASED; TRANSIENT FAULTS;

EID: 78650281499     PISSN: 13837621     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sysarc.2010.10.003     Document Type: Article
Times cited : (13)

References (22)
  • 3
    • 33750918453 scopus 로고    scopus 로고
    • A Bottom-Up Approach to On-Chip Signal Integrity
    • Integrated Circuit and System Design Power and Timing Modeling, Optimization and Simulation
    • A. Acquaviva, and A. Bogliolo A bottom-up approach to on-chip signal integrity Lecture Notes in Computer Science 2799 2003 540 549 (Pubitemid 37171589)
    • (2003) Lecture Notes in Computer Science , Issue.2799 , pp. 540-549
    • Acquaviva, A.1    Bogliolo, A.2
  • 6
    • 0003098818 scopus 로고    scopus 로고
    • 6th IEEE of the effects of transient fault injection into the VHDL model of a fault-tolerant microcomputer system
    • D. Gil, J. Garcia, J.C. Baraza, P.J. Gil, and A. Study 6th IEEE of the effects of transient fault injection into the VHDL model of a fault-tolerant microcomputer system International On-Line Testing Symposium 2000 73 79
    • (2000) International On-Line Testing Symposium , pp. 73-79
    • Gil, D.1    Garcia, J.2    Baraza, J.C.3    Gil, P.J.4    Study, A.5
  • 13
    • 39749110032 scopus 로고    scopus 로고
    • Dependable network-on-chip router able to simultaneously tolerate soft errors and crosstalk
    • DOI 10.1109/TEST.2006.297635, Reportnr 15.2, 2006 IEEE International Test Conference, ITC
    • A.P. Frantz, F.L. Kastensmidt, L. Carro, and E. Cota Dependable Network-on-Chip router able to simultaneously tolerate soft errors and crosstalk IEEE International Test Conference 2006 1 9 (Pubitemid 351303514)
    • (2007) Proceedings - International Test Conference , pp. 4079313
    • Frantz, A.P.1    Kastensmidt, F.L.2    Carro, L.3    Cota, E.4
  • 15
    • 0031078886 scopus 로고    scopus 로고
    • EMI effects and timing design for increased reliability in digital systems
    • J.F. Chappel, and S.G. Zaky EMI effects and timing design for increased reliability in digital systems IEEE Transactions on Circuits and System 1997 30 142
    • (1997) IEEE Transactions on Circuits and System , pp. 30-142
    • Chappel, J.F.1    Zaky, S.G.2
  • 16
    • 0041633864 scopus 로고    scopus 로고
    • Powered by PLI: A suitable framework for describing and modeling asynchronous circuits at all levels of abstraction
    • A. Seifhashemi, H. Pedram, and Verilog HDL Powered by PLI: a suitable framework for describing and modeling asynchronous circuits at all levels of abstraction Proceedings of IEEE 40th Deisgn Automation Conference 2003 330 333
    • (2003) Proceedings of IEEE 40th Deisgn Automation Conference , pp. 330-333
    • Seifhashemi, A.1    Pedram, H.2    Hdl, V.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.