Soft errors in commercial integrated circuits

International Journal of High Speed Electronics and Systems

Volumn 14, Issue 2, 2004, Pages 299-309

  Baumann, R C ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

Radiation effects; Single event upset; Soft error rate

Indexed keywords

DYNAMIC RANDOM ACCESS STORAGE; ELECTRONICS ENGINEERING; ERROR ANALYSIS; HIGH ENERGY PHYSICS; RADIATION EFFECTS; RELIABILITY; SILICON ON INSULATOR TECHNOLOGY; STATIC RANDOM ACCESS STORAGE;

BOROPHOSPHOSILICATE GLASSES (BPSG); SILICON PROCESS TECHNOLOGY; SINGLE EVENT UPSET (SEU); SOFT ERROR RATES (SER);

INTEGRATED CIRCUITS;

EID: 8444238226     PISSN: 01291564     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0129156404002363     Document Type: Review

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