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Volumn 2799, Issue , 2003, Pages 540-549

A bottom-up approach to on-chip signal integrity

Author keywords

[No Author keywords available]

Indexed keywords

BUSBARS; DIGITAL INTEGRATED CIRCUITS;

EID: 33750918453     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-540-39762-5_60     Document Type: Article
Times cited : (7)

References (5)
  • 1
    • 0000239119 scopus 로고    scopus 로고
    • The challenge of Signal Integrity in deep-submicrometer CMOS technology
    • Caignet F., Delmas-Bandia, S., Sicard, E.: The challenge of Signal Integrity in deep-submicrometer CMOS technology. In Proceedings of the IEEE, vol. 89, no. 4, 556-573 (2001)
    • (2001) Proceedings of the IEEE , vol.89 , Issue.4 , pp. 556-573
    • Caignet, F.1    Delmas-Bandia, S.2    Sicard, E.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.