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Volumn , Issue , 2009, Pages 93-98

An investigation of fault tolerance behavior of 32-bit DLX processor

Author keywords

[No Author keywords available]

Indexed keywords

CLOCK CYCLES; FAILURE RATE; FAULT LATENCY; SIMULATION-BASED METHOD; SYSTEM FAILURES; VHDL-MODEL;

EID: 70449449217     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DEPEND.2009.20     Document Type: Conference Paper
Times cited : (2)

References (18)
  • 3
    • 48649083927 scopus 로고    scopus 로고
    • DLX Gold: Design and Implementation of a DLX Microprocessor with Single Precision Floating-Point Operations
    • John Edrian H. Aguilar, "DLX Gold: Design and Implementation of a DLX Microprocessor with Single Precision Floating-Point Operations", IEEE Region 10 Conference TENCON, 2007, pp. 1-4.
    • (2007) IEEE Region 10 Conference TENCON , pp. 1-4
    • John Edrian, H.1    Aguilar2
  • 4
    • 0003098818 scopus 로고    scopus 로고
    • A Study of the Effects of Transient Fault Injection into the VHDL Model of a Fault-Tolerant Microcomputer System
    • D. Gil, J. Garcia, J. C. Baraza, P. J. Gil, "A Study of the Effects of Transient Fault Injection into the VHDL Model of a Fault-Tolerant Microcomputer System", 6th IEEE International On-Line Testing Symposium, 2000, pp. 73-79.
    • (2000) 6th IEEE International On-Line Testing Symposium , pp. 73-79
    • Gil, D.1    Garcia, J.2    Baraza, J.C.3    Gil, P.J.4
  • 12
    • 10444244289 scopus 로고    scopus 로고
    • Technology scaling trends and accelerated testing for soft errors in commercial silicon devices
    • R. Baumann, "Technology scaling trends and accelerated testing for soft errors in commercial silicon devices", 9th IEEE On-Line Testing Symposium, 2003, pp. 4-6.
    • (2003) 9th IEEE On-Line Testing Symposium , pp. 4-6
    • Baumann, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.