메뉴 건너뛰기




Volumn 81, Issue 4, 2010, Pages

Influence of feedback parameters on ferroelectric domain imaging with piezoresponse force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

FEEDBACK PARAMETERS; FERROELECTRIC DOMAINS; IMAGE CONTRASTS; INFLUENCE OF FEEDBACK; PHASE SIGNALS; PIEZOELECTRIC CONSTANT; PIEZOELECTRIC VIBRATION; PIEZORESPONSE; PIEZORESPONSE FORCE MICROSCOPY; SET-POINT; VECTORIAL ANALYSIS;

EID: 77952398680     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3387342     Document Type: Article
Times cited : (7)

References (27)
  • 4
    • 27144519993 scopus 로고    scopus 로고
    • Domain wall roughness in epitaxial ferroelectric PbZr0.2Ti0.8O3 thin films
    • DOI 10.1103/PhysRevLett.94.197601, 197601
    • P. Paruch, T. Giamarchi, and J. M. Triscone, Phys. Rev. Lett. PRLTAO 0031-9007 94, 197601 (2005). 10.1103/PhysRevLett.94.197601 (Pubitemid 41493006)
    • (2005) Physical Review Letters , vol.94 , Issue.19 , pp. 1-4
    • Paruch, P.1    Giamarchi, T.2    Triscone, J.-M.3
  • 7
    • 40849124215 scopus 로고    scopus 로고
    • Piezoresponse force microscopy studies of switching behavior of ferroelectric capacitors on a 100-ns time scale
    • DOI 10.1103/PhysRevLett.100.097601
    • A. Gruverman, D. Wu, and J. F. Scott, Phys. Rev. Lett. PRLTAO 0031-9007 100, 097601 (2008). 10.1103/PhysRevLett.100.097601 (Pubitemid 351399093)
    • (2008) Physical Review Letters , vol.100 , Issue.9 , pp. 097601
    • Gruverman, A.1    Wu, D.2    Scott, J.F.3
  • 12
  • 14
    • 33750197811 scopus 로고    scopus 로고
    • Quantitative analysis of ferroelectric domain imaging with piezoresponse force microscopy
    • DOI 10.1063/1.2362984
    • T. Jungk, A. Hoffmann, and E. Soergel, Appl. Phys. Lett. APPLAB 0003-6951 89, 163507 (2006). 10.1063/1.2362984 (Pubitemid 44601747)
    • (2006) Applied Physics Letters , vol.89 , Issue.16 , pp. 163507
    • Jungk, T.1    Hoffmann, A.2    Soergel, E.3
  • 15
    • 34447314531 scopus 로고    scopus 로고
    • Consequences of the background in piezoresponse force microscopy on the imaging of ferroelectric domain structures
    • DOI 10.1111/j.1365-2818.2007.01783.x
    • T. Jungk, A. Hoffmann, and E. Soergel, J. Microsc. JMICAR 0022-2720 227, 72 (2007). 10.1111/j.1365-2818.2007.01783.x (Pubitemid 47063111)
    • (2007) Journal of Microscopy , vol.227 , Issue.1 , pp. 72-78
    • Jungk, T.1    Hoffmann, A.2    Soergel, E.3
  • 16
    • 0037085895 scopus 로고    scopus 로고
    • PRBMDO 0163-1829. 10.1103/PhysRevB.65.125408
    • S. V. Kalinin and D. A. Bonnell, Phys. Rev. B PRBMDO 0163-1829 65, 125408 (2002). 10.1103/PhysRevB.65.125408
    • (2002) Phys. Rev. B , vol.65 , pp. 125408
    • Kalinin, S.V.1    Bonnell, D.A.2
  • 18
    • 0035908051 scopus 로고    scopus 로고
    • Higher order ferroic switching induced by scanning force microscopy
    • DOI 10.1103/PhysRevLett.86.5799
    • M. Abplanalp, J. Fousek, and P. Gunter, Phys. Rev. Lett. PRLTAO 0031-9007 86, 5799 (2001). 10.1103/PhysRevLett.86.5799 (Pubitemid 32577032)
    • (2001) Physical Review Letters , vol.86 , Issue.25 , pp. 5799-5802
    • Abplanalp, M.1    Fousek, J.2    Gunter, P.3
  • 21
    • 33645695615 scopus 로고    scopus 로고
    • NNOTER 0957-4484. 10.1088/0957-4484/17/6/014
    • S. Jesse, A. P. Baddorf, and S. V. Kalinin, Nanotechnology NNOTER 0957-4484 17, 1615 (2006). 10.1088/0957-4484/17/6/014
    • (2006) Nanotechnology , vol.17 , pp. 1615
    • Jesse, S.1    Baddorf, A.P.2    Kalinin, S.V.3
  • 24
    • 77952372837 scopus 로고    scopus 로고
    • See supplementary material at E-RSINAK-81-055004 for the pdf document containing the detailed PR phase spectrum of the SLN sample obtained by frequency sweemethod
    • See supplementary material at http://dx.doi.org/10.1063/1.3387342 E-RSINAK-81-055004 for the pdf document containing the detailed PR phase spectrum of the SLN sample obtained by frequency sweep method.
  • 25
    • 33746092464 scopus 로고    scopus 로고
    • Resonance enhancement in piezoresponse force microscopy: Mapping electromechanical activity, contact stiffness, and Q factor
    • DOI 10.1063/1.2221496
    • S. Jesse, B. Mirman, and S. V. Kalinin, Appl. Phys. Lett. APPLAB 0003-6951 89, 022906 (2006). 10.1063/1.2221496 (Pubitemid 44079087)
    • (2006) Applied Physics Letters , vol.89 , Issue.2 , pp. 022906
    • Jesse, S.1    Mirman, B.2    Kalinin, S.V.3
  • 26
    • 77952330522 scopus 로고    scopus 로고
    • See for the detailed properties of the SLN sample
    • See http://www.opt-oxide.com/english/product/hikaku-ln.html for the detailed properties of the SLN sample.
  • 27
    • 33846181324 scopus 로고    scopus 로고
    • Influence of the inhomogeneous field at the tip on quantitative piezoresponse force microscopy
    • DOI 10.1007/s00339-006-3768-9, Special Issue "Advances in Atomic-Scale Understanding of Nanostructures"
    • T. Jungk, A. Hoffmann, and E. Soergel, Appl. Phys. A: Mater. Sci. Process. APAMFC 0947-8396 86, 353 (2007). 10.1007/s00339-006-3768-9 (Pubitemid 46088340)
    • (2007) Applied Physics A: Materials Science and Processing , vol.86 , Issue.3 , pp. 353-355
    • Jungk, T.1    Hoffmann, A.2    Soergel, E.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.