High frequency piezoresponse force microscopy in the 1-10 MHz regime

Applied Physics Letters

Volumn 91, Issue 23, 2007, Pages

  Seal, K ^a   Jesse, S ^a   Rodriguez, B J ^a   Baddorf, A P ^a   Kalinin, S V ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; ELECTROSTATICS; IMAGING TECHNIQUES; PHOTODETECTORS; SIGNAL PROCESSING;

ELECTROSTATIC CONTRIBUTION; HIGH FREQUENCY (HF) IMAGING; PHOTODETECTOR BANDWIDTH; PIEZORESPONSE FORCE MICROSCOPY (PFM);

PIEZOELECTRIC DEVICES;

EID: 36849090031     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2814971     Document Type: Article

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