Piezoresponse force microscopy for imaging of GaN surfaces

Physica Status Solidi (A) Applications and Materials Science

Volumn 202, Issue 5, 2005, Pages 785-789

  Calarco, R ^a   Meijers, R ^a   Stoica, T ^a,b   Luth H ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b Institute of Atomic Physics   (Romania)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH RESOLUTION; INVERSION DOMAINS;

MOLECULAR BEAM EPITAXY; NANOSTRUCTURED MATERIALS; PIEZOELECTRICITY; SURFACES;

GALLIUM NITRIDE;

EID: 25444486672     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200461298     Document Type: Conference Paper

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