Detection mechanism for ferroelectric domain boundaries with lateral force microscopy

Applied Physics Letters

Volumn 89, Issue 4, 2006, Pages

  Jungk, Tobias ^a   Hoffmann, Ákos ^a   Soergel, Elisabeth ^a  

^a UNIVERSITY OF BONN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEFORMATION; ELECTRIC FIELDS; ELECTROSTATICS; GRAIN BOUNDARIES; LITHIUM NIOBATE; POLARIZATION; POTASSIUM COMPOUNDS;

CONTRAST MECHANISM; ELECTROSTATIC INTERACTIONS; FERROELECTRIC DOMAIN BOUNDARIES; LATERAL FORCE MICROSCOPY;

FERROELECTRIC MATERIALS;

EID: 33746590809     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2234303     Document Type: Article

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