Contact-resonance piezoresponse force microscope and its application to domain observation of Pb(Mg1/3Nb2/3)O3-PbTiO3 single crystals

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 42, Issue 9 B, 2003, Pages 6209-6213

  Okino, Hirotake ^a   Sakamoto, Junichi ^a   Yamamoto, Takashi ^a  

^a NATIONAL DEFENSE ACADEMY   (Japan)

Author keywords

Contact resonance; Domain imaging; Piezoresponse force microscopy; PMN PT; Relaxor ferroelectrics

Indexed keywords

CRYSTAL STRUCTURE; ELECTRODES; FERROELECTRICITY; HIGH TEMPERATURE EFFECTS; MICROSCOPIC EXAMINATION; PIEZOELECTRICITY; POLARIZATION; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY; VACUUM APPLICATIONS;

CIRCULAR DOMAINS; CONTACT RESONANCE; DOMAIN STRUCTURE; PIEZORESPONSE FORCE MICROSCOPY; POLARIZATION REVERSALS; RELAXOR FERROELECTRICS;

LEAD COMPOUNDS;

EID: 0345603581     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.6209     Document Type: Article

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