Mechanical crosstalk between vertical and lateral piezoresponse force microscopy

Review of Scientific Instruments

Volumn 77, Issue 3, 2006, Pages

  Peter, F ^a   Rudiger A ^a   Waser, R ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

CANTILEVER BEAMS; CROSSTALK; DIODES; LASER BEAMS; NANOSTRUCTURED MATERIALS;

GEOMETRICAL CONSTRAINTS; LATERAL PIEZORESPONSE FORCE MICROSCOPY; MECHANICAL CROSSTALK; VERTICAL PIEZORESPONSE FORCE MICROSCOPY;

PIEZOELECTRICITY;

EID: 33645823418     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2176081     Document Type: Article

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