Consequences of the background in piezoresponse force microscopy on the imaging of ferroelectric domain structures

Journal of Microscopy

Volumn 227, Issue 1, 2007, Pages 72-78

  Jungk, T ^a   Hoffmann, A ^a   Soergel, E ^a  

^a UNIVERSITY OF BONN   (Germany)

Author keywords

Ferroelectric domains; Piezoresponse force microscopy

Indexed keywords

FERROELECTRIC MATERIALS; FERROELECTRICITY; SCANNING PROBE MICROSCOPY;

DOMAIN BOUNDARY; FERROELECTRIC DOMAIN STRUCTURE; FERROELECTRIC DOMAINS; MICROSCOPE IMAGES; NULLING; PIEZORESPONSE FORCE MICROSCOPES; PIEZORESPONSE FORCE MICROSCOPY;

IMAGE ENHANCEMENT;

ARTICLE; CHEMICAL STRUCTURE; IMAGING SYSTEM; MATHEMATICAL ANALYSIS; MICROSCOPY; PIEZOELECTRICITY; PIEZORESPONSE FORCE MICROSCOPY; PRIORITY JOURNAL;

EID: 34447314531     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2007.01783.x     Document Type: Article

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