Contributions to in-plane piezoresponse on axially symmetrical samples

Review of Scientific Instruments

Volumn 76, Issue 10, 2005, Pages 1-3

  Peter, F ^a   Rudiger A ^a   Waser, R ^a   Szot, K ^a,c   Reichenberg, B ^b  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b AIXACCT SYSTEMS GMBH   (Germany)

^c UNIVERSITY OF SILESIA   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROCHEMISTRY; ELECTROMECHANICAL DEVICES; MICROSCOPIC EXAMINATION; POLARIZATION;

PIEZORESPONSE FORCE MICROSCOPY (PFM); RADIAL SYMMETRY; SURFACE STATES;

PIEZOELECTRICITY;

EID: 27544488383     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2090367     Document Type: Review

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