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Volumn 7, Issue 5, 2010, Pages

Wetting behavior of solders

Author keywords

IMC; Lead free solders; Microstructure; Wetting

Indexed keywords

BASE METALS; DRIVING FORCES; ELECTRONIC CIRCUITS; EXPERIMENTAL CONDITIONS; HEALTH CONCERNS; IMC; IMC LAYER; INTERFACIAL MICROSTRUCTURE; INTERFACIAL REACTIONS; INTERMETALLIC COMPOUNDS; LEAD-FREE SOLDERS; METAL INTERFACE; METALLURGICAL REACTION; OPTIMUM THICKNESS; REACTIVE SYSTEM; SOLDER JOINT RELIABILITY; SOLDER JOINTS; SOLDER MATERIAL; SOLDER WETTING; SPREADING KINETICS; STRUCTURAL DEFECT; SUBSTRATE METALS; UNIFORM LAYER; WETTING BEHAVIOR;

EID: 77953561778     PISSN: None     EISSN: 1546962X     Source Type: Journal    
DOI: 10.1520/JAI103055     Document Type: Article
Times cited : (10)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.