Effects of surface roughness on wettability

Acta Materialia

Volumn 46, Issue 7, 1998, Pages 2313-2318

  Nakae, Hideo ^a   Inui, Ryuichi ^a   Hirata, Yosuke ^a   Saito, Hiroyuki ^b  

^a WASEDA UNIVERSITY   (Japan)

^b NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT ANGLE; HYSTERESIS; INTERFACES (MATERIALS); MATHEMATICAL MODELS; PARAFFINS; WATER; WETTING;

HEMIROUND RODS CLOSE PACKED MODEL; HEMISPHERICAL CLOSE PACKED MODEL; SESSILE DROP METHOD; SURFACE HEIGHT ROUGHNESS; WENZEL ROUGHNESS FACTOR; WETTABILITY;

SURFACE ROUGHNESS;

EID: 0032035903     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/s1359-6454(97)00387-x     Document Type: Article

References (15)

1. Wenzel, R. N., Ind. Eng. Chem., 1936, 28, 988.
2. Shuttleworth, R. and Bailey, G. L., Discuss. Farady Soc., 1948, 3, 16.
3. Johnson, R. E. Jr. and Dettre, R. H., Surf. Colloid Sci., 1969, 2, 85.
4. Cassie, A. B. D. and Baxter, S., Trans. Faraday Soc., 1944, 40, 546.
5. Cassie, A. B. D., Discussions Fraday Soc., 1948, 3, 11.
6. Drelich, J., Wilbur, J. L., Miller, J. D. and Whitesides, G. M., Langmuir, 1996, 12, 1913.
7. Mori, N., Ukita, M. and Ohgi, K., J. Jpn Inst. Metals, 1991, 55, 820.
8. Hitchcock, S. J., Carroll, N. T. and Nicholas, M. G., J. Mater. Sci., 1981, 16, 714.
9. Kawai, A. and Nagata, H., Jpn. J. Appl. Phys., 1994, 33, Pt. 2, No. 9A, L1283.
10. Asahara, S. and Goto, K., KOGYOKAGAKU, 1955, 58, 864.
11. Navascues, G., Rep. Prog. Phys., 1979, 42, 1131.
12. Dettre, R. H. and Johnson, R. E. Jr., Advan. Chem., 1964, 43, 136.
13. Laurent, V., Chatain, D., Chatillon, C. and Eustathopoulos, N., Acta metall., 1988, 36, 1797.
14. Fujii, H., Nakae, H. and Okada, K., Acta metall. mater., 1993, 41, 2963.
15. Johnson, R. E., Jr. and Dettre, R. H., Contact Angle, Wettability, and Adhesion, Advances in Chemistry Series, Vol. 3. American Chemical Soc., 1964, p. 112.