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Volumn 10, Issue 4, 2010, Pages 1188-1195
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Possible current-transport mechanisms in the (Ni/Au)/Al0.22Ga0.78N/AlN/GaN Schottky barrier diodes at the wide temperature range
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Author keywords
Barrier inhomogeneity; Current transport mechanisms; Double Gaussian distribution; Series resistance
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Indexed keywords
BARRIER HEIGHTS;
BARRIER INHOMOGENEITIES;
CURRENT-TRANSPORT MECHANISMS;
ELECTRICAL CHARACTERISTIC;
ELECTRICAL PARAMETER;
IDEALITY FACTORS;
INHOMOGENEITIES;
LINEAR REGION;
RICHARDSON CONSTANT;
RICHARDSON PLOT;
SERIES RESISTANCES;
STANDARD DEVIATION;
TEMPERATURE DEPENDENT;
TEMPERATURE RANGE;
THEORETICAL VALUES;
TRANSPORT MECHANISM;
ZERO-BIAS;
GALLIUM;
GAUSSIAN DISTRIBUTION;
THERMIONIC EMISSION;
SCHOTTKY BARRIER DIODES;
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EID: 77951252271
PISSN: 15671739
EISSN: None
Source Type: Journal
DOI: 10.1016/j.cap.2010.02.008 Document Type: Article |
Times cited : (39)
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References (48)
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