메뉴 건너뛰기




Volumn 10, Issue 4, 2010, Pages 1188-1195

Possible current-transport mechanisms in the (Ni/Au)/Al0.22Ga0.78N/AlN/GaN Schottky barrier diodes at the wide temperature range

Author keywords

Barrier inhomogeneity; Current transport mechanisms; Double Gaussian distribution; Series resistance

Indexed keywords

BARRIER HEIGHTS; BARRIER INHOMOGENEITIES; CURRENT-TRANSPORT MECHANISMS; ELECTRICAL CHARACTERISTIC; ELECTRICAL PARAMETER; IDEALITY FACTORS; INHOMOGENEITIES; LINEAR REGION; RICHARDSON CONSTANT; RICHARDSON PLOT; SERIES RESISTANCES; STANDARD DEVIATION; TEMPERATURE DEPENDENT; TEMPERATURE RANGE; THEORETICAL VALUES; TRANSPORT MECHANISM; ZERO-BIAS;

EID: 77951252271     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2010.02.008     Document Type: Article
Times cited : (39)

References (48)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.