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Volumn 234, Issue 1-4, 2004, Pages 67-71

Electrical behaviour of Al/SiO 2 /Si structures with SiC nanocrystals

Author keywords

Electrical behaviour; Epitaxy; MIS; Nanocrystals; SiC

Indexed keywords

CRYSTALS; ELECTRIC CONDUCTIVITY; EPITAXIAL GROWTH; INTERFACES (MATERIALS); NANOSTRUCTURED MATERIALS; SCHOTTKY BARRIER DIODES; SILICA; SILICON CARBIDE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 3342959925     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.05.067     Document Type: Conference Paper
Times cited : (17)

References (10)
  • 5
    • 0032299186 scopus 로고    scopus 로고
    • V. Kumar, S.K. Agarwal (Eds.), Narosa Publishing House, New Delhi, India, and references therein
    • Zs. J. Horváth, in: V. Kumar, S.K. Agarwal (Eds.), Physics of Semiconductor Devices, Narosa Publishing House, New Delhi, India, 1998, pp. 1085-1092, and references therein.
    • (1998) Physics of Semiconductor Devices , pp. 1085-1092
    • Horváth, Zs.J.1
  • 9
    • 3342940410 scopus 로고    scopus 로고
    • HP 4271B Digital LCR Meter
    • HP 4271B Digital LCR Meter.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.