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Volumn 11, Issue 5, 2010, Pages 951-962

In-situ scanning transmission X-ray microscopy of catalytic solids and related nanomaterials

Author keywords

Electron microscopy; Fischer Tropsch catalysts; In situ scanning transmission X ray microscopy (STXM); Nanomaterials

Indexed keywords

CATALYSTS; ELECTRON ENERGY LEVELS; ELECTRON MICROSCOPY; ELECTRON SCATTERING; ELECTRONS; ENERGY DISSIPATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOSTRUCTURED MATERIALS; SCANNING; SCANNING ELECTRON MICROSCOPY; X RAY MICROSCOPES; X RAYS;

EID: 77950360571     PISSN: 14394235     EISSN: 14397641     Source Type: Journal    
DOI: 10.1002/cphc.200901023     Document Type: Review
Times cited : (107)

References (75)
  • 10
    • 77950344739 scopus 로고    scopus 로고
    • XASEELS website
    • F. de Groot XASEELS website, www.anorg.chem.uu.nl/people/staff/FrankdeGroot/xaseels.htm. 2010, 3.
    • (2010) , pp. 3
    • de Groot, F.1
  • 46
    • 0018436046 scopus 로고
    • Quantitative Electron Spectroscopy of Surfaces: A Standard Data Base for Electron Inelastic Mean Free Paths in Solids
    • M. P. Seah, W. A. Dench, Quantitative Electron Spectroscopy of Surfaces: A Standard Data Base for Electron Inelastic Mean Free Paths in Solids, Surface and Interface Anal. 1, 2, 1979.
    • (1979) Surface and Interface Anal , vol.1 , pp. 2
    • Seah, M.P.1    Dench, W.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.