Mapping Surface Chemistry and Molecular Orientation with Combinatorial Near-Edge X-Ray Absorption Fine Structure Spectroscopy

Macromolecular Rapid Communications

Volumn 25, Issue 1, 2004, Pages 141-149

  Fischer, Daniel A ^a   Efimenko, Kirill ^b   Bhat, Rajendra R ^b   Sambasivan, Sharadha ^a   Genzer, Jan ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b North Carolina State University   (United States)

Author keywords

Catalysis; Nanotechnology; Near edge X ray absorption fine structure (NEXAFS); Self assembly; Zeolites

Indexed keywords

CATALYSTS; MOLECULAR ORIENTATION; MONOLAYERS; PROPYLENE; SPECTROSCOPY; STRUCTURE (COMPOSITION); SURFACE PROPERTIES; X RAY ANALYSIS; ZEOLITES;

MOLECULAR SENSITIVITY; REHYBRIDIZATION;

SURFACE CHEMISTRY;

ABSORPTION; ABSORPTION SPECTROSCOPY; ACIDITY; CATALYSIS; CATALYST; CHEMICAL BINDING; COMBINATORIAL CHEMISTRY; COMPUTER MODEL; NANOPARTICLE; NANOTECHNOLOGY; NEAR EDGE X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; REVIEW; SOLID STATE; STRUCTURE ANALYSIS; X RAY ANALYSIS;

EID: 0442294842     PISSN: 10221336     EISSN: None     Source Type: Journal    
DOI: 10.1002/marc.200300178     Document Type: Review

References (39)

1. E. J. Amis, X.-D. Xiang, J.-C. Zhao, MRS Bull. 2002, 27, 295.
2. R. B. van Dover, L. F. Scheemeyer, R. M. Fleming, Nature 1998, 392, 162.
3. B. Jandeleit, D. J. Schaefer, T. S. Powers, H. W. Turner, W. H. Weinberg, Angew. Chem. Int. Ed. 1999, 38, 2494.
4. J. Stöhr, "NEXAFS Spectroscopy", Springer, Berlin 1992.
5. [5a] J. Stöhr, R. Jaeger, Phys. Rev. B 1982, 26, 4111;
6. [5b] F. Sette, J. Stöhr, A. P. Hitchcock, J. Chem. Phys. 1984, 81, 4906.
7. [6a] G. Hähner, M. Kinzel, C. Wöll, M. Grunze, M. K. Scheller, L. S. Cederbaum, Phys. Rev. Lett. 1991, 67, 851;
8. [6b] G. Hähner, M. Kinzel, C. Thümmler, C. Wöll, M. Grunze, J. Vac. Sci. Technol., A 1992, 10, 2758.
9. [7a] D. A. Outka, J. Stöhr, J. P. Rabe, J. D. Swalen, H. H. Rotermnd, Phys. Rev. Lett. 1987, 59, 1321;
10. [7b] D. A. Outka, J. Stöhr, J. P. Rabe, J. D. Swalen, J. Chem. Phys. 1988, 88, 4076.
11. T. Ohta, K. Seki, T. Yokoama, I. Morisada, K. Edamatsu, Phys. Scr. 1990, 41, 150.
12. C. Ziegler, T. Schnedel-Niedrig, G. Beamson, D. T. Clark, W. R. Salaneck, H. Sotobayashi, A. M. Bradshaw, Langmuir 1994, 10, 4399.
13. M. G. Samant, J. Stöhr, H. R. Brown, T. P. Russell, J. M. Sands, S. K. Kumar, Macromolecules 1996, 29, 8334.
14. W. E. S. Unger, A. Lippitz, C. Wöll, W. Heckmann, Fresenius' J. Anal. Chem. 1997, 358, 89.
15. J. Genzer, E. Sivaniah, E. J. Kramer, J. Wang, H. Körner, M. Xiang, K. Char, C. K. Ober, M. K. Chaudhury, B. M. DeKoven, R. A. Bubeck, S. Sambasivan, D. A. Fischer, Macromolecules 2000, 33, 1882.
16. D. A. Fischer, G. E. Mitchell, A. T. Yeh, J. L. Gland, Appl. Surf. Sci. 1998, 133, 58.
17. J. Genzer, E. Sivaniah, E. J. Kramer, J. Wang, M. Xiang, K. Char, C. K. Ober, R. A. Bubeck, D. A. Fischer, M. Graupe, R. Colorado, Jr., O. E. Shmakova, T. R. Lee, Macromolecules 2000, 33, 6068.
18. T. Hayakawa, J. Wang, M. Xiang, X. Li, M. Ueda, C. K. Ober, J. Genzer, E. Sivaniah, E. J. Kramer, D. A. Fischer, Macromolecules 2000, 33, 8012.
19. M. Xiang, X. Li, C. K. Ober, K. Char, J. Genzer, E. Sivaniah, E. J. Kramer, D. A. Fischer, Macromolecules 2000, 33, 6106.
20. J. Genzer, E. Sivaniah, E. J. Kramer, J. Wang, H. Kömer, K. Char, C. K. Ober, B. M. DeKoven, R. A. Bubeck, D. A. Fischer, S. Sambasivan, Langmuir 2000, 16, 1993.
21. J. Stöhr, M. G. Samant, J. Electron Spectrosc. Rel. Phenom. 1999, 98-99, 189.
22. J. Genzer, K. Efimenko, Science 2000, 290, 2130.
23. For detailed information about the NIST/Dow Soft X-Ray Materials Characterization Facility at NSLS BNL, see: http://nslsweb.nsls.bnl.gov/nsls/pubs/newsletters/96-nov.pdf.
24. D. A. Fischer, S. Sambasivan, A. Kuperman, Y. Platonov, J. L. Wood, Rev. Sci. Instrum. 2002, 73, 1469.
25. J. Genzer, E. J. Kramer, D. A. Fischer, J. Appl. Phys. 2002, 92, 7070.
26. J. Genzer, D. A. Fischer, K. Efimenko, Appl. Phys. Lett. 2003, 82, 266.
27. M. K. Chaudhury, G. M. Whitesides, Science 1992, 256, 1529.
28. [25a] B. Jäger, H. Schürmann, H. U. Müller, H.-J. Himmel, M. Neumann, M. Grunze, C. Wöll, Z. Phys. Chem. 1997, 202, 263;
29. [25b] M. Wirde, U. Gelius, T. Dunbar, D. L. Allara, Nucl. Instrum. Methods Phys. Res., Sect. B 1997, 131, 245;
30. [25c] M. Zhamikov, W. Geyer, A. Gölzhäuser, S. Frey, M. Grunze, Phys. Chem. Chem. Phys. 1999, 1, 3163.
31. J. Genzer, K. Efimenko, D. A. Fischer, Langmuir 2002, 18, 9307.
32. K. Efimenko, J. Genzer, Adv. Mater. 2001, 13, 1560.
33. K. Efimenko, D. A. Fischer, J. Genzer, unpublished results.
34. J. Genzer, D. A. Fischer, K. Efimenko, Adv. Mater. 2003, 15, 1545.
35. R. R. Bhat, D. A. Fischer, J. Genzer, Langmuir 2002, 18, 5640.
36. K. C. Grabar, R. G. Freeman, M. B. Hommer, M. J. Natan, Anal. Chem. 1995, 67, 735.
37. K. C. Grabar, P. C. Smith, M. D. Musick, J. A. Davis, D. G. Walter, M. A. Jackson, A. P. Guthrie, M. J. Natan, J. Am. Chem. Soc. 1996, 118, 1148.
38. S. Sambasivan, D. A. Fischer, A. Kuperman, B. M. DeKoven, Adv. Mater. 2000, 12, 1809.
39. A. M. Gabelnick, D. J. Burnett, J. L. Gland, D. A. Fischer, J. Phys. Chem. 2001, B105, 7748.