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Volumn 9, Issue 4, 2002, Pages 254-257

A new bend-magnet beamline for scanning transmission X-ray microscopy at the advanced light source

Author keywords

Bend magnets; Diffraction limit; NEXAFS; Scanning microscopy; Zone plates

Indexed keywords

ARTICLE;

EID: 0036657957     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049502005502     Document Type: Article
Times cited : (109)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.