-
2
-
-
36549095032
-
-
Jordan-Sweet, J. L.; Kovac, C. A.; Goldberg, M. J.; Morar, J. F. J. Chem. Phys. 1989, 89, 2482.
-
(1989)
J. Chem. Phys.
, vol.89
, pp. 2482
-
-
Jordan-Sweet, J.L.1
Kovac, C.A.2
Goldberg, M.J.3
Morar, J.F.4
-
3
-
-
0001236303
-
-
Ohta, T.; Seki, K.; Yokoyama, T.; Morisada, I.; Edamatsu, K. Phys. Scr. 1990, 41, 150.
-
(1990)
Phys. Scr.
, vol.41
, pp. 150
-
-
Ohta, T.1
Seki, K.2
Yokoyama, T.3
Morisada, I.4
Edamatsu, K.5
-
4
-
-
0001165107
-
-
Castner, D. G.; Lewis, K. B.; Fischer, D. A.; Ratner, B. D.; Gland, J. L. Langmuir, 1993, 9, 537.
-
(1993)
Langmuir
, vol.9
, pp. 537
-
-
Castner, D.G.1
Lewis, K.B.2
Fischer, D.A.3
Ratner, B.D.4
Gland, J.L.5
-
5
-
-
0004237782
-
-
Springer Series in Surface Science No. 25; Springer-Verlag: Berlin
-
Stöhr, J. NEXAFS Spectroscopy, Springer Series in Surface Science No. 25; Springer-Verlag: Berlin), 1992.
-
(1992)
NEXAFS Spectroscopy
-
-
Stöhr, J.1
-
6
-
-
0029004946
-
-
Kirz, J.; Jacobsen, C.; Howells, M. Q. Rev. Biophys. 1995, 33, 33.
-
(1995)
Q. Rev. Biophys.
, vol.33
, pp. 33
-
-
Kirz, J.1
Jacobsen, C.2
Howells, M.3
-
7
-
-
0027677467
-
-
Fischer, D. A.; Moodenbaugh, A. R.; Xu, Y. Physica C 1993, 215, 279.
-
(1993)
Physica C
, vol.215
, pp. 279
-
-
Fischer, D.A.1
Moodenbaugh, A.R.2
Xu, Y.3
-
8
-
-
0001722887
-
-
Leapman, R.; Grunes, L.; Fejes, P. L. Phys. Rev. B 1982, 26. 614; Leapman, R. D.; Silcox, J. Phys. Rev. Lett. 1979, 42, 1361.
-
(1982)
Phys. Rev. B
, vol.26
, pp. 614
-
-
Leapman, R.1
Grunes, L.2
Fejes, P.L.3
-
9
-
-
0001148450
-
-
Leapman, R.; Grunes, L.; Fejes, P. L. Phys. Rev. B 1982, 26. 614; Leapman, R. D.; Silcox, J. Phys. Rev. Lett. 1979, 42, 1361.
-
(1979)
Phys. Rev. Lett.
, vol.42
, pp. 1361
-
-
Leapman, R.D.1
Silcox, J.2
-
10
-
-
0029184614
-
-
(a) Ouchi, I.; Nakai, I.; Kamada, M.; Tanaka, S.; Hagiwara, T. Polym. J. 1995, 2, 127.
-
(1995)
Polym. J.
, vol.2
, pp. 127
-
-
Ouchi, I.1
Nakai, I.2
Kamada, M.3
Tanaka, S.4
Hagiwara, T.5
-
11
-
-
0029722810
-
-
(b) Lippitz, A.; Friedrich, J. F.; Unger, W. E. S.; Schertel, A.; Wöll, Ch. Polymer 1996, 37, 3151.
-
(1996)
Polymer
, vol.37
, pp. 3151
-
-
Lippitz, A.1
Friedrich, J.F.2
Unger, W.E.S.3
Schertel, A.4
Wöll, Ch.5
-
12
-
-
0027113912
-
-
Ade, H.; Zhang, X.; Cameron, S.; Costello, C.; Kirz, J.; Williams, S. Science, 1992, 258, 972.
-
(1992)
Science
, vol.258
, pp. 972
-
-
Ade, H.1
Zhang, X.2
Cameron, S.3
Costello, C.4
Kirz, J.5
Williams, S.6
-
20
-
-
0346902828
-
-
Rightor, E. G.; Young, G. P.; Urquhart, S. G.; Hitchcock, A. P. Microscopy The Key Reseach Tool 1992, 22, 67.
-
(1992)
Microscopy the Key Reseach Tool
, vol.22
, pp. 67
-
-
Rightor, E.G.1
Young, G.P.2
Urquhart, S.G.3
Hitchcock, A.P.4
-
21
-
-
33751391304
-
-
Hitchcock, A. P.; Urquhart, S. G.; Rightor, E. G. J. Phys. Chem. 1992, 96, 8736.
-
(1992)
J. Phys. Chem.
, vol.96
, pp. 8736
-
-
Hitchcock, A.P.1
Urquhart, S.G.2
Rightor, E.G.3
-
22
-
-
84979400213
-
-
Urquhart, S. G.; Hitchcock, A. P.; Rightor, E. G.; Priester, R. D.; Leapman, R. D. J. Polym. Sci. B Polym. Phys. 1995, 33, 1593.
-
(1995)
J. Polym. Sci. B Polym. Phys.
, vol.33
, pp. 1593
-
-
Urquhart, S.G.1
Hitchcock, A.P.2
Rightor, E.G.3
Priester, R.D.4
Leapman, R.D.5
-
24
-
-
84979424176
-
-
Urquhart, S. G.; Hitchcock, A. P.; Rightor, E. G.; Priester, R. D. J. Polymer Sci. B Polym. Phys. 1995, 33, 1603.
-
(1995)
J. Polymer Sci. B Polym. Phys.
, vol.33
, pp. 1603
-
-
Urquhart, S.G.1
Hitchcock, A.P.2
Rightor, E.G.3
Priester, R.D.4
-
25
-
-
0017958514
-
-
Isaacson, M.; Utlaut, M. Optik 1978, 50, 213. Isaacson, M. S. In Principles and Techniques of Electron Microscopy; Hayat, M., Ed.; Van Nostrand-Reinhold: New York, 1977; Vol. 7.
-
(1978)
Optik
, vol.50
, pp. 213
-
-
Isaacson, M.1
Utlaut, M.2
-
26
-
-
0342393896
-
-
Hayat, M., Ed.; Van Nostrand-Reinhold: New York
-
Isaacson, M.; Utlaut, M. Optik 1978, 50, 213. Isaacson, M. S. In Principles and Techniques of Electron Microscopy; Hayat, M., Ed.; Van Nostrand-Reinhold: New York, 1977; Vol. 7.
-
(1977)
Principles and Techniques of Electron Microscopy
, vol.7
-
-
Isaacson, M.S.1
-
27
-
-
0023534312
-
-
Egerton, R. F.; Crozier, P. A.; Rice, P. Ultramicroscopy 1987, 23, 305.
-
(1987)
Ultramicroscopy
, vol.23
, pp. 305
-
-
Egerton, R.F.1
Crozier, P.A.2
Rice, P.3
-
28
-
-
0027478820
-
-
Ciliax, B. J.; Kirk, K. L.; Leapman, R. D. Ultramicroscopy 1993, 48, 13.
-
(1993)
Ultramicroscopy
, vol.48
, pp. 13
-
-
Ciliax, B.J.1
Kirk, K.L.2
Leapman, R.D.3
-
29
-
-
0006937384
-
-
Zaera, F.; Fischer, D. A.; Shen, S.; Gland, J. L. Surf. Sci. 1988, 194, 205.
-
(1988)
Surf. Sci.
, vol.194
, pp. 205
-
-
Zaera, F.1
Fischer, D.A.2
Shen, S.3
Gland, J.L.4
-
30
-
-
0001557086
-
-
Fischer, D. A.; Colbert, J.; Gland, J. L. Rev. Sci. Instrum 1989, 60, 1596.
-
(1989)
Rev. Sci. Instrum
, vol.60
, pp. 1596
-
-
Fischer, D.A.1
Colbert, J.2
Gland, J.L.3
-
31
-
-
0026260878
-
-
Jacobsen, C.; Williams, S.; Anderson, E.; Brown, M. T.; Buckley, C. J.; Kern, D.; Kirz, J.; Rivers, M.; Zhang, X. Opt. Commun. 1991, 86, 351. Zhang, X.; Jacobsen, C.; Williams, S. In Soft X-ray Microscopy; Jacobsen, C.; Trebes, J., Eds.; Proc. SPIE 1992, 1741, 251.
-
(1991)
Opt. Commun.
, vol.86
, pp. 351
-
-
Jacobsen, C.1
Williams, S.2
Anderson, E.3
Brown, M.T.4
Buckley, C.J.5
Kern, D.6
Kirz, J.7
Rivers, M.8
Zhang, X.9
-
32
-
-
84913069254
-
-
Soft X-ray Microscopy; Jacobsen, C.; Trebes, J., Eds.
-
Jacobsen, C.; Williams, S.; Anderson, E.; Brown, M. T.; Buckley, C. J.; Kern, D.; Kirz, J.; Rivers, M.; Zhang, X. Opt. Commun. 1991, 86, 351. Zhang, X.; Jacobsen, C.; Williams, S. In Soft X-ray Microscopy; Jacobsen, C.; Trebes, J., Eds.; Proc. SPIE 1992, 1741, 251.
-
(1992)
Proc. SPIE
, vol.1741
, pp. 251
-
-
Zhang, X.1
Jacobsen, C.2
Williams, S.3
-
33
-
-
0001207077
-
-
Kirz, J.; Ade, H.; Howells, M.; Jacobsen, C.; Ko, C.-H.; Lindaas, S.; McNulty, I.; Sayre, D.; Williams, S.; Zhang, X. Rev. Sci. Instrum. 1992, 63, 557.
-
(1992)
Rev. Sci. Instrum.
, vol.63
, pp. 557
-
-
Kirz, J.1
Ade, H.2
Howells, M.3
Jacobsen, C.4
Ko, C.-H.5
Lindaas, S.6
McNulty, I.7
Sayre, D.8
Williams, S.9
Zhang, X.10
-
34
-
-
0013491597
-
-
Padmore, H. A.; Warwick, T. J. Synchrotron Rad. 1994, 1, 27. Warwick, T.; Ade, A.; Hitchcock, A. P.; Padmore, H. A.; Rightor, E. G.; Tonner, B. P. J. Electron Spectrosc., submitted.
-
(1994)
Synchrotron Rad.
, vol.1
, pp. 27
-
-
Padmore, H.A.1
Warwick, T.J.2
-
35
-
-
5544313212
-
-
submitted
-
Padmore, H. A.; Warwick, T. J. Synchrotron Rad. 1994, 1, 27. Warwick, T.; Ade, A.; Hitchcock, A. P.; Padmore, H. A.; Rightor, E. G.; Tonner, B. P. J. Electron Spectrosc., submitted.
-
J. Electron Spectrosc.
-
-
Warwick, T.1
Ade, A.2
Hitchcock, A.P.3
Padmore, H.A.4
Rightor, E.G.5
Tonner, B.P.6
-
36
-
-
0000985065
-
-
Ma, Y.; Chen, C. T.; Meigs, G.; Randall, K.; Sette, F. Phys. Rev. A 1991, 44, 1848.
-
(1991)
Phys. Rev. A
, vol.44
, pp. 1848
-
-
Ma, Y.1
Chen, C.T.2
Meigs, G.3
Randall, K.4
Sette, F.5
-
38
-
-
0343572244
-
-
Henke, B. L.; Lee, P.; Tanaka, T. J.; Shimabukuro, R. L.; Fujikawa B. K. At. Data Nucl. Data Tables 1982, 27, 1.
-
(1982)
At. Data Nucl. Data Tables
, vol.27
, pp. 1
-
-
Henke, B.L.1
Lee, P.2
Tanaka, T.J.3
Shimabukuro, R.L.4
Fujikawa, B.K.5
-
39
-
-
0023023630
-
-
Krivanek. O. L.; Ahn, C. C.; Keeney, R. B. Ultramicroscopy 1987, 22, 103. Krivanek, O. L.; Paterson, J. H.; Poppa, H. R. Proc. 47th EMSA 1989, p 410.
-
(1987)
Ultramicroscopy
, vol.22
, pp. 103
-
-
Krivanek, O.L.1
Ahn, C.C.2
Keeney, R.B.3
-
40
-
-
0023023630
-
-
Krivanek. O. L.; Ahn, C. C.; Keeney, R. B. Ultramicroscopy 1987, 22, 103. Krivanek, O. L.; Paterson, J. H.; Poppa, H. R. Proc. 47th EMSA 1989, p 410.
-
(1989)
Proc. 47th EMSA
, pp. 410
-
-
Krivanek, O.L.1
Paterson, J.H.2
Poppa, H.R.3
-
42
-
-
78651082670
-
-
Hunt, J. A.; Leapman, R. D.; Williams, D. B. Proc. 27th MBAS 1993, 2, 272.
-
(1993)
Proc. 27th MBAS
, vol.2
, pp. 272
-
-
Hunt, J.A.1
Leapman, R.D.2
Williams, D.B.3
-
43
-
-
84985209686
-
-
Leapman, R. D.; Fiori, C. I.; Swyt, C. R. J. Microsc. 1984, 133, 239.
-
(1984)
J. Microsc.
, vol.133
, pp. 239
-
-
Leapman, R.D.1
Fiori, C.I.2
Swyt, C.R.3
-
44
-
-
0003020971
-
-
Disko, M. M., Ahn, C. C., Fultz, B., Eds.
-
Leapman, R. D. In Transmission Electron Energy Loss Spectroscopy in Materials Science; Disko, M. M., Ahn, C. C., Fultz, B., Eds.; 1992; p 47.
-
(1992)
Transmission Electron Energy Loss Spectroscopy in Materials Science
, pp. 47
-
-
Leapman, R.D.1
-
45
-
-
0003702114
-
-
Creative Arts Bldg, Indiana University, Bloomington, IN 47404
-
Howell, J.; Rossi, A.; Wallace, D.; Haraki, K.; Hoffmann, R. FORTICON8 Program QCMP011 from Quantum Chemistry Program Exchange, Creative Arts Bldg, Indiana University, Bloomington, IN 47404.
-
FORTICON8 Program QCMP011 from Quantum Chemistry Program Exchange
-
-
Howell, J.1
Rossi, A.2
Wallace, D.3
Haraki, K.4
Hoffmann, R.5
-
49
-
-
4344712940
-
-
Rühl, E.; Wen, A. T.; Hitchcock, A. P. J. Electron Spectrosc. 1991, 57, 137.
-
(1991)
J. Electron Spectrosc.
, vol.57
, pp. 137
-
-
Rühl, E.1
Wen, A.T.2
Hitchcock, A.P.3
-
50
-
-
0010020073
-
-
Wen, A. T.; Rühl, E.; Hitchcock, A. P. Organometallics 1992, 11, 2559.
-
(1992)
Organometallics
, vol.11
, pp. 2559
-
-
Wen, A.T.1
Rühl, E.2
Hitchcock, A.P.3
-
53
-
-
0023534312
-
-
Egerton, R. E.; Crozier, P. A.; Rice, P. Ultramicroscopy 1987, 23, 305.
-
(1987)
Ultramicroscopy
, vol.23
, pp. 305
-
-
Egerton, R.E.1
Crozier, P.A.2
Rice, P.3
-
56
-
-
0029346240
-
-
Zhang, X.; Jacobsen, C.; Lindaas, S.; and Williams, S. J. Vac. Sci. Technol. B 1995, 13, 1477.
-
(1995)
J. Vac. Sci. Technol. B
, vol.13
, pp. 1477
-
-
Zhang, X.1
Jacobsen, C.2
Lindaas, S.3
Williams, S.4
-
57
-
-
0029346826
-
-
Tinone, M. C. K., Tanaka, K.; Ueno, N. J. Vac. Sci. Technol. A 1995, 13, 1885.
-
(1995)
J. Vac. Sci. Technol. A
, vol.13
, pp. 1885
-
-
Tinone, M.C.K.1
Tanaka, K.2
Ueno, N.3
-
58
-
-
0003127215
-
-
Wollersheim, O.; Zumaqué, H.; Hormes, J.; Kadereit, D.; Langen, J.; Haussling, L.; Hoessel, P.; Hoffmann, G. Nucl. Instrum. Methods B 1995, 97, 273.
-
(1995)
Nucl. Instrum. Methods B
, vol.97
, pp. 273
-
-
Wollersheim, O.1
Zumaqué, H.2
Hormes, J.3
Kadereit, D.4
Langen, J.5
Haussling, L.6
Hoessel, P.7
Hoffmann, G.8
-
59
-
-
5544252355
-
-
in press
-
Urquhart, S. G.; Hitchcock, A. P.; Rightor, E. G.; Smith, P. A.; Ade, H. Proc. Mater. Res. Soc., in press.
-
Proc. Mater. Res. Soc.
-
-
Urquhart, S.G.1
Hitchcock, A.P.2
Rightor, E.G.3
Smith, P.A.4
Ade, H.5
-
60
-
-
0043164424
-
-
Jolly, W. L.; Bomben, K. D.; Eyermann, C. J. At. Data Nucl. Data Tables 1984, 31, 109.
-
(1984)
At. Data Nucl. Data Tables
, vol.31
, pp. 109
-
-
Jolly, W.L.1
Bomben, K.D.2
Eyermann, C.J.3
-
61
-
-
0003685412
-
-
Wiley: New York
-
Beamson, G.; Briggs, D. High Resolution XPS of Organic Polymers: The Scienta ESCA300 Database; Wiley: New York, 1992. The narrowest line in their XPS spectrum of PET is 0.85 eV fwhm (C 1s(C=O)) whereas the C 1s(ring) peak is 1.0 eV wide. Two 0.85 eV peaks separated by 0.5 eV in a 2:1 ratio gives a near symmetric peak 1.0 eV in width. From this we conclude that the C 1s(C-R) IP is ∼0.5 eV above the C 1s(C-H) IP. A lower resolution XPS spectrum of PET, along with a discussion of the dependence of the XPS on conformation, is given in: Boulanger, P.; Pireaux, J. J.; Berbist, J. J.; Delhalle, J. J. Electron Spectrosc. 1993, 63, 53.
-
(1992)
High Resolution XPS of Organic Polymers: The Scienta ESCA300 Database
-
-
Beamson, G.1
Briggs, D.2
-
62
-
-
0012639553
-
-
Beamson, G.; Briggs, D. High Resolution XPS of Organic Polymers: The Scienta ESCA300 Database; Wiley: New York, 1992. The narrowest line in their XPS spectrum of PET is 0.85 eV fwhm (C 1s(C=O)) whereas the C 1s(ring) peak is 1.0 eV wide. Two 0.85 eV peaks separated by 0.5 eV in a 2:1 ratio gives a near symmetric peak 1.0 eV in width. From this we conclude that the C 1s(C-R) IP is ∼0.5 eV above the C 1s(C-H) IP. A lower resolution XPS spectrum of PET, along with a discussion of the dependence of the XPS on conformation, is given in: Boulanger, P.; Pireaux, J. J.; Berbist, J. J.; Delhalle, J. J. Electron Spectrosc. 1993, 63, 53.
-
(1993)
J. Electron Spectrosc.
, vol.63
, pp. 53
-
-
Boulanger, P.1
Pireaux, J.J.2
Berbist, J.J.3
Delhalle, J.4
-
64
-
-
0030580642
-
-
Bagus, P. S.; Weiss, K.; Schertel, A.; Wöll, Ch.; Braun, W.; Hellwig, C.; Jung, C. Chem. Phys. Lett. 1996, 248, 129.
-
(1996)
Chem. Phys. Lett.
, vol.248
, pp. 129
-
-
Bagus, P.S.1
Weiss, K.2
Schertel, A.3
Wöll, Ch.4
Braun, W.5
Hellwig, C.6
Jung, C.7
-
66
-
-
5544233374
-
-
in press
-
Urquhart, S. G.; Hitchcock, A. P.; Smith, A. P.; Ade, H.; Rightor, E. G. J. Phys. Chem., in press.
-
J. Phys. Chem.
-
-
Urquhart, S.G.1
Hitchcock, A.P.2
Smith, A.P.3
Ade, H.4
Rightor, E.G.5
|