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Volumn 101, Issue 11, 1997, Pages 1950-1960

Spectromicroscopy of poly(ethylene terephthalate): Comparison of spectra and radiation damage rates in X-ray absorption and electron energy loss

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ELECTRON ENERGY LOSS SPECTROSCOPY; FLUORESCENCE; RADIATION DAMAGE; SCANNING ELECTRON MICROSCOPY; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY; X RAY SPECTROSCOPY;

EID: 0031100276     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp9622748     Document Type: Review
Times cited : (177)

References (67)
  • 5
    • 0004237782 scopus 로고
    • Springer Series in Surface Science No. 25; Springer-Verlag: Berlin
    • Stöhr, J. NEXAFS Spectroscopy, Springer Series in Surface Science No. 25; Springer-Verlag: Berlin), 1992.
    • (1992) NEXAFS Spectroscopy
    • Stöhr, J.1
  • 9
    • 0001148450 scopus 로고
    • Leapman, R.; Grunes, L.; Fejes, P. L. Phys. Rev. B 1982, 26. 614; Leapman, R. D.; Silcox, J. Phys. Rev. Lett. 1979, 42, 1361.
    • (1979) Phys. Rev. Lett. , vol.42 , pp. 1361
    • Leapman, R.D.1    Silcox, J.2
  • 25
    • 0017958514 scopus 로고
    • Isaacson, M.; Utlaut, M. Optik 1978, 50, 213. Isaacson, M. S. In Principles and Techniques of Electron Microscopy; Hayat, M., Ed.; Van Nostrand-Reinhold: New York, 1977; Vol. 7.
    • (1978) Optik , vol.50 , pp. 213
    • Isaacson, M.1    Utlaut, M.2
  • 26
  • 32
    • 84913069254 scopus 로고
    • Soft X-ray Microscopy; Jacobsen, C.; Trebes, J., Eds.
    • Jacobsen, C.; Williams, S.; Anderson, E.; Brown, M. T.; Buckley, C. J.; Kern, D.; Kirz, J.; Rivers, M.; Zhang, X. Opt. Commun. 1991, 86, 351. Zhang, X.; Jacobsen, C.; Williams, S. In Soft X-ray Microscopy; Jacobsen, C.; Trebes, J., Eds.; Proc. SPIE 1992, 1741, 251.
    • (1992) Proc. SPIE , vol.1741 , pp. 251
    • Zhang, X.1    Jacobsen, C.2    Williams, S.3
  • 34
    • 0013491597 scopus 로고
    • Padmore, H. A.; Warwick, T. J. Synchrotron Rad. 1994, 1, 27. Warwick, T.; Ade, A.; Hitchcock, A. P.; Padmore, H. A.; Rightor, E. G.; Tonner, B. P. J. Electron Spectrosc., submitted.
    • (1994) Synchrotron Rad. , vol.1 , pp. 27
    • Padmore, H.A.1    Warwick, T.J.2
  • 61
    • 0003685412 scopus 로고
    • Wiley: New York
    • Beamson, G.; Briggs, D. High Resolution XPS of Organic Polymers: The Scienta ESCA300 Database; Wiley: New York, 1992. The narrowest line in their XPS spectrum of PET is 0.85 eV fwhm (C 1s(C=O)) whereas the C 1s(ring) peak is 1.0 eV wide. Two 0.85 eV peaks separated by 0.5 eV in a 2:1 ratio gives a near symmetric peak 1.0 eV in width. From this we conclude that the C 1s(C-R) IP is ∼0.5 eV above the C 1s(C-H) IP. A lower resolution XPS spectrum of PET, along with a discussion of the dependence of the XPS on conformation, is given in: Boulanger, P.; Pireaux, J. J.; Berbist, J. J.; Delhalle, J. J. Electron Spectrosc. 1993, 63, 53.
    • (1992) High Resolution XPS of Organic Polymers: The Scienta ESCA300 Database
    • Beamson, G.1    Briggs, D.2
  • 62
    • 0012639553 scopus 로고
    • Beamson, G.; Briggs, D. High Resolution XPS of Organic Polymers: The Scienta ESCA300 Database; Wiley: New York, 1992. The narrowest line in their XPS spectrum of PET is 0.85 eV fwhm (C 1s(C=O)) whereas the C 1s(ring) peak is 1.0 eV wide. Two 0.85 eV peaks separated by 0.5 eV in a 2:1 ratio gives a near symmetric peak 1.0 eV in width. From this we conclude that the C 1s(C-R) IP is ∼0.5 eV above the C 1s(C-H) IP. A lower resolution XPS spectrum of PET, along with a discussion of the dependence of the XPS on conformation, is given in: Boulanger, P.; Pireaux, J. J.; Berbist, J. J.; Delhalle, J. J. Electron Spectrosc. 1993, 63, 53.
    • (1993) J. Electron Spectrosc. , vol.63 , pp. 53
    • Boulanger, P.1    Pireaux, J.J.2    Berbist, J.J.3    Delhalle, J.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.