An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy

Journal of Electron Spectroscopy and Related Phenomena

Volumn 170, Issue 1-3, 2009, Pages 4-12

  Howells, M R ^a   Beetz, T ^b   Chapman, H N ^c   Cui, C ^a   Holton, J M ^a,d   Jacobsen, C J ^a,b   Kirz, J ^a,b   Lima, E ^b   Marchesini, S ^a   Miao, H ^b   Sayre, D ^b   Shapiro, D A ^a   Spence, J C H ^a,e   Starodub, D ^e  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b STONY BROOK UNIVERSITY   (United States)

^c LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^d UNIVERSITY OF CALIFORNIA   (United States)

^e ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Coherent X rays; Diffraction imaging; Dose fractionation; Frozen hydrated samples; Radiation damage

Indexed keywords

DAMAGE DETECTION; DIFFRACTION; HYDRATES; HYDRATION; IMAGE QUALITY; NUCLEAR INSTRUMENTATION; RADIATION; RADIATION DAMAGE; THREE DIMENSIONAL; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

BIOLOGICAL SAMPLES; COHERENT X-RAYS; DIFFRACTION IMAGING; DOSE FRACTIONATION; EXPERIMENTAL EVIDENCES; FROZEN-HYDRATED SAMPLES; HIGH RESOLUTIONS; LIFE SCIENCE; MATERIAL SCIENCE; NANOMETER RESOLUTIONS; NEW FORMS; NUMBER OF DATUM; SCIENCE APPLICATIONS; STATISTICAL ANALYSIS; THIRD GENERATIONS; THREE-DIMENSIONAL IMAGING; TRANSMISSION ELECTRON MICROSCOPES; WELL-COVERED; X-RAY DIFFRACTION MICROSCOPIES; X-RAY IMAGING; X-RAY SOURCES;

X RAYS;

EID: 62049084227     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2008.10.008     Document Type: Article

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