Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source

Journal of Synchrotron Radiation

Volumn 5, Issue 3, 1998, Pages 1090-1092

  Warwick, T ^a   Ade, H ^b   Cerasari, S ^a,c   Denlinger, J ^d   Franck, K ^a   Garcia, A ^a,b   Hayakawa, S ^e   Hitchcock, A ^f   Kikuma, J ^g   Klingler, S ^a   Kortright, J ^a   Morisson, G ^a   Moronne, M ^a   Rightor, E ^h   Rotenberg, E ^a   Seal, S ^a   Shin, H J ^a,i   Steele, W F ^a   Tonner, B P ^j  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

^c UNIVERSITY OF TRIESTE   (Italy)

^d UNIVERSITY OF MICHIGAN   (United States)

^e UNIVERSITY OF TOKYO   (Japan)

^f MCMASTER UNIVERSITY   (Canada)

^g ASAHI CHEMICAL INDUSTRY CO   (Japan)

^h DOW CHEMICAL COMPANY   (United States)

ⁱ POSTECH   (South Korea)

^j UNIVERSITY OF WISCONSIN MILWAUKEE   (United States)

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Author keywords

NEXAFS; Spectromicroscopy; XPS; Zone plates

Indexed keywords

EID: 0032398995     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049597014283     Document Type: Article

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