Scanning soft X-ray spectromicroscopy at the Pohang Light Source: Commissioning results

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 467-468, Issue PART II, 2001, Pages 909-912

  Shin, H J ^a   Lee, M K ^a  

^a POSTECH   (South Korea)

Author keywords

Spectromicroscopy; SPEM; STXM; X ray microscopy

Indexed keywords

EID: 0001433505     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)00517-4     Document Type: Article

References (7)

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7. H.J. Shin, M.K. Lee, Rev. Sci. Instrum, submitted.