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Volumn 50, Issue 3, 2010, Pages 351-355

The frequency-dependent electrical characteristics of interfaces in the Sn/p-Si metal semiconductor structures

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL CHARACTERISTIC; EXPERIMENTAL VALUES; FREQUENCY CHARACTERISTIC; FREQUENCY DEPENDENCE; FREQUENCY DISPERSION; FREQUENCY-DEPENDENT; HIGH FREQUENCY; INTERFACE STATE; INTERFACE STATE DENSITY; INTERFACES STATE; LOW FREQUENCY; LOWER FREQUENCIES; METAL SEMICONDUCTORS; METAL-SEMICONDUCTOR STRUCTURES; QUANTITATIVE INFORMATION; SCHOTTKY STRUCTURES; SERIES RESISTANCES;

EID: 76849087079     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2009.10.017     Document Type: Article
Times cited : (40)

References (40)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.