The determination of the interface state density distribution of the Al/methyl red/p-Si Schottky barrier diode by using a capacitance method

Physica B: Condensed Matter

Volumn 388, Issue 1-2, 2007, Pages 244-248

  Kilicoglu T ^a   Aydin, M E ^a   Ocak, Y S ^a  

^a DICLE UNIVERSITY   (Turkey)

Author keywords

Methyl red; Organic inorganic semiconductor contact; Schottky diodes

Indexed keywords

ALUMINUM COMPOUNDS; CAPACITANCE; CARRIER CONCENTRATION; ELECTRIC PROPERTIES; ENERGY GAP; INTERFACES (MATERIALS);

INTERFACE STATE DENSITY; METHYL RED; ORGANIC-INORGANIC SEMICONDUCTOR CONTACT; VALENCE BAND;

SCHOTTKY BARRIER DIODES;

EID: 33751211552     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2006.06.126     Document Type: Article

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