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Volumn 46, Issue 16, 2005, Pages 6148-6153

Characterization of capacitance-frequency features of Sn/polypyrrole/n-Si structure as a function of temperature

Author keywords

Interface state of density; Polypyrrole; Relaxation time

Indexed keywords

CAPACITANCE; FREQUENCIES; SILICON; SPECTROSCOPIC ANALYSIS;

EID: 21744436444     PISSN: 00323861     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.polymer.2005.04.102     Document Type: Article
Times cited : (36)

References (47)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.