On the profile of frequency dependent series resistance and surface states in Au/Bi4Ti3O12/SiO2/n-Si(MFIS) structures

Microelectronic Engineering

Volumn 85, Issue 1, 2008, Pages 81-88

  Parlakturk F ^a   Altindal, Ş ^b   Tataroglu A ^b   Parlak, M ^c   Agasiev, A ^d  

^a TURKISH ATOMIC ENERGY AUTHORITY   (Turkey)

^b GAZI UNIVERSITY   (Turkey)

^c MIDDLE EAST TECHNICAL UNIVERSITY   (Turkey)

^d BAKU STATE UNIVERSITY   (Azerbaijan)

Author keywords

Frequency dependence; Insulator layer; MFIS structure; Series resistance; Surface states

Indexed keywords

CAPACITANCE; ELECTRIC RESISTANCE; NATURAL FREQUENCIES; SEMICONDUCTOR MATERIALS; SILICA; VOLTAGE MEASUREMENT;

FREQUENCY DEPENDENT SERIES; FREQUENCY DISPERSION;

GOLD COMPOUNDS;

EID: 36148942809     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2007.03.012     Document Type: Article

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