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Solid State Communications

Volumn 135, Issue 8, 2005, Pages 490-495

The effect of series resistance on capacitance-voltage characteristics of Schottky barrier diodes

(3) Sahin B a Cetin H a Ayyildiz, E a

a ERCIYES UNIVERSITY (Turkey)

Author keywords

A. Metal insulator semiconductor structures; D. Contact resistance; D. Schottky barriers

Indexed keywords

CAPACITANCE; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; FREQUENCIES; PARAMETER ESTIMATION; SEMICONDUCTOR MATERIALS; VOLTAGE MEASUREMENT;

CAPACITANCE-VOLTAGE (C-V); CONTACT RESISTANCE; METAL-INSULATOR-SEMICONDUCTOR STRUCTURES; SCHOTTKY BARRIERS;

SCHOTTKY BARRIER DIODES;

EID: 22644443809 PISSN: 00381098 EISSN: None Source Type: Journal
DOI: 10.1016/j.ssc.2005.05.050 Document Type: Article

Times cited : (99)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.