Simulation technologies for cosmic ray neutron-induced soft errors: models and simulation systems

IEEE Transactions on Nuclear Science

Volumn 46, Issue 3 PART 3, 1999, Pages 774-780

  Tosaka, Y ^a   Kanata, H ^a   Itakura, T ^a   Satoh, S ^a  

^a FUJITSU LABORATORIES LTD   (Japan)

Author keywords

BGR model; Cosmic ray neutrons; MBGR; Neutron induced soft error; NISES; Soft error simulator

Indexed keywords

CMOS INTEGRATED CIRCUITS; COSMIC RAYS; DYNAMIC RANDOM ACCESS STORAGE; EQUATIONS OF MOTION; ERROR CORRECTION; HEAVY IONS; MOLECULAR DYNAMICS; MONTE CARLO METHODS; NEUTRONS; QUANTUM THEORY; SEMICONDUCTOR STORAGE; STATISTICAL METHODS;

ANTISYMMETRIC MOLECULAR DYNAMICS; BURST GENERATION RATE; COSMIC RAY NEUTRON INDUCED SOFT ERROR;

COMPUTER SIMULATION;

EID: 0033335620     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.774176     Document Type: Article

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