Design for resilience to soft errors and variations

Proceedings - IOLTS 2007 13th IEEE International On-Line Testing Symposium

Volumn , Issue , 2007, Pages 23-28

  Zhang, Ming ^a   Mak, T M ^a   Tschanz, Jim ^a   Kim, Kee Sup ^a   Seifert, Norbert ^a   Lu, Davia ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADAPTIVE SYSTEMS; ERROR DETECTION; ERRORS; MICROPROCESSOR CHIPS; SULFATE MINERALS;

BUILT IN SOFT ERROR RESILIENCE; ERROR-RESILIENT; INTERNATIONAL (CO); ON LINE TESTING; PROCESS VARIATIONS; RELIABLE SYSTEMS; SOFT ERROR CORRECTION; SOFT ERRORS (SE); SYSTEM ADAPTATION;

ERROR CORRECTION;

EID: 46749103715     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IOLTS.2007.26     Document Type: Conference Paper

References (13)

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