A fast, analytical estimator for the SEU-induced pulse width in combinational designs

Proceedings - Design Automation Conference

Volumn , Issue , 2008, Pages 918-923

  Garg, Rajesh ^a   Nagpal, Charu ^a   Khatri, Sunil P ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

Analysis; Model; Single event upset (SEU)

Indexed keywords

ANALYSIS; MODEL; PULSE WIDTH; SINGLE EVENT UPSET (SEU);

COMPUTER AIDED DESIGN; DESIGN; DIGITAL INTEGRATED CIRCUITS; INDUSTRIAL ENGINEERING; LOGIC CIRCUITS; RADIATION EFFECTS; URANIUM POWDER METALLURGY;

NETWORKS (CIRCUITS);

EID: 51549113427     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DAC.2008.4555951     Document Type: Conference Paper

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