메뉴 건너뛰기




Volumn , Issue , 2006, Pages 767-772

MARS-C: Modeling and reduction of soft errors in combinational circuits

Author keywords

Reliability symbolic techniques; SER

Indexed keywords

CIRCUIT SIMULATION; ERROR CORRECTION; GATES (TRANSISTOR); NANOELECTRONICS; THRESHOLD VOLTAGE; VOLTAGE CONTROL;

EID: 33847715275     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1146909.1147104     Document Type: Conference Paper
Times cited : (130)

References (18)
  • 1
    • 0142184763 scopus 로고    scopus 로고
    • Cost-Effective Approach for Reducing Soft Error Failure Rate in Logic Circuits
    • ITC, pp
    • K. Mohanram and N. A. Touba. Cost-Effective Approach for Reducing Soft Error Failure Rate in Logic Circuits. In Proc. of International Test Conference (ITC), pp. 893-901, 2003.
    • (2003) Proc. of International Test Conference , pp. 893-901
    • Mohanram, K.1    Touba, N.A.2
  • 2
    • 21244491597 scopus 로고    scopus 로고
    • Soft Errors in Advanced Computer Systems
    • R. C. Baumann. Soft Errors in Advanced Computer Systems. In IEEE Design and Test of Computers, Vol. 22, Issue 3, 2005.
    • (2005) IEEE Design and Test of Computers , vol.22 , Issue.3
    • Baumann, R.C.1
  • 3
    • 0022769976 scopus 로고
    • Graph-Based Algorithms for Boolean Function Manipulation
    • August
    • R. E. Bryant. Graph-Based Algorithms for Boolean Function Manipulation. In IEEE Transaction on Computers, C-35-8, pp. 677-691, August 1986.
    • (1986) IEEE Transaction on Computers , vol.C-35-8 , pp. 677-691
    • Bryant, R.E.1
  • 4
    • 85165849361 scopus 로고    scopus 로고
    • R. I. Bahar, E. A. Frohm, C. M. Gaona, G. D. Hachtel, E. Macii, A. Pardo, F. Somenzi. Algebraic Decision Diagrams and Their Applications. In Proc. of ACM/IEEE International Conference on Computer Aided Design (ICCAD), pp. 188-191, November 1993.
    • R. I. Bahar, E. A. Frohm, C. M. Gaona, G. D. Hachtel, E. Macii, A. Pardo, F. Somenzi. Algebraic Decision Diagrams and Their Applications. In Proc. of ACM/IEEE International Conference on Computer Aided Design (ICCAD), pp. 188-191, November 1993.
  • 5
    • 85165843242 scopus 로고    scopus 로고
    • C. Zhao, X. Bai, and S. Dey. A Scalable Soft Spot Analysis Methodology for Noise Effects in Nano-meter Circuits. In Proc. of ACM/IEEE Design Automation Conference (DAC), pp. 894-899, June 2004.
    • C. Zhao, X. Bai, and S. Dey. A Scalable Soft Spot Analysis Methodology for Noise Effects in Nano-meter Circuits. In Proc. of ACM/IEEE Design Automation Conference (DAC), pp. 894-899, June 2004.
  • 8
    • 85165859065 scopus 로고    scopus 로고
    • S. Krishnaswamy, G. F. Viamonte, I. L. Markov, and J. P. Hayes. Accurate Reliability Evaluation and Enhancement via Probabilistic Transfer Matrices. In Proc. of Design, Automation and Test in Europe (DATE), pp. 282-287, March 2005.
    • S. Krishnaswamy, G. F. Viamonte, I. L. Markov, and J. P. Hayes. Accurate Reliability Evaluation and Enhancement via Probabilistic Transfer Matrices. In Proc. of Design, Automation and Test in Europe (DATE), pp. 282-287, March 2005.
  • 9
    • 84944062057 scopus 로고    scopus 로고
    • th IEEE International On-Line Testing Symposium, IOLTS'03, pp. 11-115, July 2003.
    • th IEEE International On-Line Testing Symposium, IOLTS'03, pp. 11-115, July 2003.
  • 11
    • 85165863689 scopus 로고    scopus 로고
    • P. Liden, P. Dahlgren, R. Johansson, and J. Karlsson. On Latching Probability of Particle Induced Transients in Combinational Networks. In Proc. of Fault-Tolerant Computing Symposium, pp. 340-349, 1994.
    • P. Liden, P. Dahlgren, R. Johansson, and J. Karlsson. On Latching Probability of Particle Induced Transients in Combinational Networks. In Proc. of Fault-Tolerant Computing Symposium, pp. 340-349, 1994.
  • 12
    • 0031373956 scopus 로고    scopus 로고
    • Attenuation of Single Event Induced Puises in CMOS Combinational Logic
    • December
    • M. P. Baze and S. P. Buehner. Attenuation of Single Event Induced Puises in CMOS Combinational Logic. In IEEE Transaction on Nuclear Science, Vol. 44, No. 6, pp. 2217-2223, December 1997.
    • (1997) In IEEE Transaction on Nuclear Science , vol.44 , Issue.6 , pp. 2217-2223
    • Baze, M.P.1    Buehner, S.P.2
  • 15
    • 16244405890 scopus 로고    scopus 로고
    • Cost-Effective Radiation Hardening Technique for Combinational Logic
    • ICCAD, pp, November
    • Q. Zhou and K. Mohanram. Cost-Effective Radiation Hardening Technique for Combinational Logic. In Proc. of International Conference on Computer-Aided Design (ICCAD), pp. 100-106, November 2004.
    • (2004) Proc. of International Conference on Computer-Aided Design , pp. 100-106
    • Zhou, Q.1    Mohanram, K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.