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Volumn 517, Issue 23, 2009, Pages 6218-6224

Non-intrusive plasma diagnostics for the deposition of large area thin film silicon

Author keywords

Microcrystalline silicon; Plasma processing and deposition; Silane

Indexed keywords

FOURIER TRANSFORM INFRARED ABSORPTION SPECTROSCOPY; GAS UTILIZATION; HIGH DEPOSITION RATES; MICROCRYSTALLINITY; NON-INTRUSIVE; OPTIMAL REACTOR; PARALLEL PLATES; PLASMA CHEMISTRIES; PLASMA CHEMISTRY MODELS; PLASMA PARAMETER; PLASMA PROCESSING AND DEPOSITION; PROCESS OPTIMIZATION; PUMPING LINES; SHOWERHEAD; SILICON THIN FILM; THIN FILM SILICON; TIME RESOLVED OPTICAL EMISSION SPECTROSCOPY;

EID: 68349083584     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.02.053     Document Type: Article
Times cited : (15)

References (29)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.