Determination of wurtzite InN/cubic In2O3 heterojunction band offset by x-ray photoelectron spectroscopy

Applied Physics Letters

Volumn 94, Issue 22, 2009, Pages

  Song, H P ^a   Yang, A L ^a   Wei, H Y ^a   Guo, Y ^a   Zhang, B ^a   Zheng, G L ^a   Yang, S Y ^a   Liu, X L ^a   Zhu, Q S ^a   Wang, Z G ^a   Yang, T Y ^b   Wang, H H ^b  

^a INSTITUTE OF SEMICONDUCTORS   (China)

^b INSTITUTE OF HIGH ENERGY PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BAND OFFSETS; CONDUCTION BAND OFFSET; ELECTRONIC DEVICE; HETEROSYSTEMS; VALENCE BAND OFFSETS; WURTZITE; X RAY PHOTOEMISSION SPECTROSCOPY;

ELECTRON MOBILITY; EMISSION SPECTROSCOPY; HETEROJUNCTIONS; OZONE WATER TREATMENT; PHOTOELECTRICITY; ZINC SULFIDE;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 66749113449     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3151956     Document Type: Article

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