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Volumn 68, Issue 18, 1996, Pages 2541-2543
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Valence-band discontinuities of wurtzite GaN, AlN, and InN heterojunctions measured by x-ray photoemission spectroscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
BAND STRUCTURE;
BINDING ENERGY;
CALCULATIONS;
ELECTRIC FIELD EFFECTS;
MOLECULAR BEAM EPITAXY;
NITRIDES;
PIEZOELECTRICITY;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
STRAIN;
X RAY PHOTOELECTRON SPECTROSCOPY;
ALUMINUM NITRIDE;
CORE LEVELS;
FORWARD BACKWARD ASYMMETRY;
GALLIUM NITRIDE;
INDIUM NITRIDE;
PIEZOELECTRIC STRAIN EFFECT;
VALENCE BAND DISCONTINUITIES;
HETEROJUNCTIONS;
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EID: 0030127795
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.116177 Document Type: Article |
Times cited : (604)
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References (9)
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