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Volumn 156, Issue 7, 2009, Pages

Electroless copper deposition with PEG suppression for all-copper flip-chip connections

Author keywords

[No Author keywords available]

Indexed keywords

CONTROLLED DEPOSITION; COPPER CHIPS; COPPER PILLARS; ELECTROLESS COPPER; ELECTROLESS COPPER DEPOSITION; ELEVATED TEMPERATURE; FABRICATION TECHNIQUE; FLIP-CHIP CONNECTIONS; HIGH QUALITY; HIGH TEMPERATURE; LOW TEMPERATURE ANNEALING; NITROGEN ENVIRONMENT; PLATING RATES; PROCESS TIME; RESTRICTED REGIONS;

EID: 65949094581     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.3123288     Document Type: Article
Times cited : (26)

References (26)
  • 1
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    • International Technology Roadmafor Semiconductors: Assembly and Packaging, Semiconductor Industry Association, San Jose, CA.
    • International Technology Roadmap for Semiconductors: Assembly and Packaging, Semiconductor Industry Association, San Jose, CA (2007).
    • (2007)
  • 5
    • 0035304419 scopus 로고    scopus 로고
    • 0361-5235,. 10.1007/s11664-001-0039-6
    • K. N. Chen, A. Fan, and R. Reif, J. Electron. Mater. 0361-5235, 30, 331 (2001). 10.1007/s11664-001-0039-6
    • (2001) J. Electron. Mater. , vol.30 , pp. 331
    • Chen, K.N.1    Fan, A.2    Reif, R.3
  • 14
    • 37849188970 scopus 로고    scopus 로고
    • 1521-3323,. 10.1109/TADVP.2006.884812
    • S. Gao and A. S. Holmes, IEEE Trans. Adv. Packag. 1521-3323, 29, 725 (2006). 10.1109/TADVP.2006.884812
    • (2006) IEEE Trans. Adv. Packag. , vol.29 , pp. 725
    • Gao, S.1    Holmes, A.S.2
  • 18
    • 18544366704 scopus 로고    scopus 로고
    • 0013-4686,. 10.1016/j.electacta.2005.01.009
    • C. H. Lee, S. C. Lee, and J. J. Kim, Electrochim. Acta 0013-4686, 50, 3563 (2005). 10.1016/j.electacta.2005.01.009
    • (2005) Electrochim. Acta , vol.50 , pp. 3563
    • Lee, C.H.1    Lee, S.C.2    Kim, J.J.3
  • 25
    • 0004234072 scopus 로고    scopus 로고
    • p, Wiley Interscience, New York.
    • M. Paunovic, Modern Electroplating, pp. 648-649, Wiley Interscience, New York (2000).
    • (2000) Modern Electroplating , pp. 648-649
    • Paunovic, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.