Observation of Si(1 0 0) surface with noncontact atomic force microscope at 5 K

Applied Surface Science

Volumn 188, Issue 3-4, 2002, Pages 279-284

  Uozumi, T ^a   Tomiyoshi, Y ^a   Suehira, N ^a   Sugawara, Y ^a   Morita, S ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Frequency modulation technique; Low temperature atomic force microscope; Noncontact atomic force microscope; Si(1 0 0)

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL DEFECTS; DIMERS; IMAGE ANALYSIS; IMAGING TECHNIQUES; LOW TEMPERATURE EFFECTS; OPTICAL RESOLVING POWER; SEMICONDUCTING SILICON;

ATOMIC RESOLUTION IMAGES;

SURFACE STRUCTURE;

EID: 0037187221     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00939-4     Document Type: Conference Paper

References (19)