A review of statistical methods for quality improvement and control in nanotechnology

Journal of Quality Technology

Volumn 41, Issue 2, 2009, Pages 148-164

  Lu, Jye Chyi ^a,d   Jeng, Shuen Lin ^b,e   Wang, Kaibo ^c,e  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^c TSINGHUA UNIVERSITY   (China)

^d Sch of Indust and Syst Eng   (United States)

^e Department of Statistics ^*  (China)

Author keywords

Automatic control; Experimental design; Nanomanufacturing; Physical statistical modeling; Statistical quality control; Stochastic modeling

Indexed keywords

AUTOMATION; CONTROL; DESIGN OF EXPERIMENTS; NANOTECHNOLOGY; OPTIMIZATION; PROCESS CONTROL; STATISTICAL METHODS; STATISTICS; STOCHASTIC CONTROL SYSTEMS; STOCHASTIC MODELS; STOCHASTIC SYSTEMS; UNCERTAINTY ANALYSIS;

HYPOTHESIS TESTING; NANO-MANUFACTURING; NANOSCALE APPLICATIONS; QUALITY IMPROVEMENT; STATISTICAL MODELING; STATISTICAL QUALITY CONTROL; TREATMENT EFFECTS; UNCERTAINTY MODELING;

QUALITY CONTROL;

EID: 64549128226     PISSN: 00224065     EISSN: None     Source Type: Journal    
DOI: 10.1080/00224065.2009.11917770     Document Type: Review

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