Fast and accurate estimation of nano-scaled SRAM read failure probability using Critical Point Sampling

Proceedings of the Custom Integrated Circuits Conference

Volumn 2005, Issue , 2005, Pages 439-442

  Chang, Ik Joon ^a   Kang, Kunhyuk ^a   Mukhopadhyay, Saibal ^a   Kim, Chris H ^b   Roy, Kaushik ^a  

^a PURDUE UNIVERSITY   (United States)

^b UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; FAILURE ANALYSIS; MATHEMATICAL MODELS; OPTIMIZATION; PARAMETER ESTIMATION; PROBABILITY;

COMPUTATIONAL SPEED; CRITICAL POINT SAMPLING; PROBABILITY ESTIMATION;

STATIC RANDOM ACCESS STORAGE;

EID: 33847100084     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CICC.2005.1568700     Document Type: Conference Paper

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