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Volumn 42, Issue 10, 2004, Pages 987-1000

Multiscale modeling of polycrystalline silicon

Author keywords

Micromorphic theory; Multiscale modeling; Polycrystalline; Silicon

Indexed keywords

AMORPHOUS MATERIALS; CRYSTAL STRUCTURE; DEFORMATION; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; ISOTHERMS; LATTICE CONSTANTS; SHEAR STRESS; THERMAL LOAD; WAVE PROPAGATION;

EID: 2542478214     PISSN: 00207225     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijengsci.2003.11.004     Document Type: Article
Times cited : (12)

References (13)
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  • 3
    • 0037211732 scopus 로고    scopus 로고
    • Examining physical foundation of continuum theories from viewpoint of phonon dispersion relation
    • Chen Y., Lee J.D., Eskandarian A. Examining physical foundation of continuum theories from viewpoint of phonon dispersion relation. Int. J. Eng. Sci. 41:2003;61-83.
    • (2003) Int. J. Eng. Sci. , vol.41 , pp. 61-83
    • Chen, Y.1    Lee, J.D.2    Eskandarian, A.3
  • 4
    • 0037408633 scopus 로고    scopus 로고
    • Determining material constants in micromorphic theory through phonon dispersion relations
    • Chen Y., Lee J.D. Determining material constants in micromorphic theory through phonon dispersion relations. Int. J. Eng. Sci. 41:2003;871-886.
    • (2003) Int. J. Eng. Sci. , vol.41 , pp. 871-886
    • Chen, Y.1    Lee, J.D.2
  • 5
    • 78249260349 scopus 로고    scopus 로고
    • Thermal warpage and pressure nonlinearity analyses for monolithic piezoresistive sensing elements
    • J.A. Chiou, Thermal warpage and pressure nonlinearity analyses for monolithic piezoresistive sensing elements, in: Proceedings of IMECE 2002, 2002.
    • (2002) Proceedings of IMECE 2002
    • Chiou, J.A.1
  • 6
    • 0020127035 scopus 로고
    • Silicon as a mechanical material
    • Peterson K. Silicon as a mechanical material. Proc. IEEE. 70(5):1972;420-457.
    • (1972) Proc. IEEE , vol.70 , Issue.5 , pp. 420-457
    • Peterson, K.1
  • 8
    • 0036531038 scopus 로고    scopus 로고
    • Amorphous-silicon thin-film transistors deposited by VHF-PECVD and hot-wire CVD
    • Stannowski B., Schropp R.E.I., Wehrspohn R.B., Powell M.J. Amorphous-silicon thin-film transistors deposited by VHF-PECVD and hot-wire CVD. J. Non-Cryst. Solids. 299-302:2002;1340-1344.
    • (2002) J. Non-cryst. Solids , vol.299-302 , pp. 1340-1344
    • Stannowski, B.1    Schropp, R.E.I.2    Wehrspohn, R.B.3    Powell, M.J.4
  • 11
    • 0034244461 scopus 로고    scopus 로고
    • Grain boundaries in barium strontium titanate thin films structure, chemistry and influence on electronic properties
    • Stemmer S., Streiffer S.K., Browning N.D., Bascert C., Kingon A.I. Grain boundaries in barium strontium titanate thin films structure, chemistry and influence on electronic properties. Interface Sci. 8:2000;209-221.
    • (2000) Interface Sci. , vol.8 , pp. 209-221
    • Stemmer, S.1    Streiffer, S.K.2    Browning, N.D.3    Bascert, C.4    Kingon, A.I.5
  • 13
    • 0031143796 scopus 로고    scopus 로고
    • Dynamical simulations of nonequilibrium processes - Heat flow and the Kapitza resistance across grain boundaries
    • Maiti A., Mahan G.D., Pantelides S.T. Dynamical simulations of nonequilibrium processes - heat flow and the Kapitza resistance across grain boundaries. Solid State Commun. 102:1997;517-521.
    • (1997) Solid State Commun. , vol.102 , pp. 517-521
    • Maiti, A.1    Mahan, G.D.2    Pantelides, S.T.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.