Surface-sensitive conductance measurements

Journal of Physics Condensed Matter

Volumn 21, Issue 1, 2009, Pages

  Hofmann, Ph ^a,b   Wells, J W ^a,c  

^a AARHUS UNIVERSITY   (Denmark)

^b UNIVERSITY OF LIVERPOOL   (United Kingdom)

^c NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTANCE MEASUREMENTS; NANO-SCALE; PROBE TECHNIQUES; QUASI ONE-DIMENSIONAL; SEMI METALS; SEMI-CONDUCTOR SURFACES; SI (1 1 1); TWO MODEL SYSTEMS;

METALLOIDS; SEMICONDUCTING SILICON COMPOUNDS; SILVER;

PHASE TRANSITIONS;

EID: 64149119106     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/21/1/013003     Document Type: Article

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